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Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design.
Michael Gössel
Egor S. Sogomonyan
Published in:
VTS (1994)
Keyphrases
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fault detection
logic circuits
error correction
concurrent programs
industrial processes
fault diagnosis
fault isolation
circuit design
constraint satisfaction
code generation
tennessee eastman
machine learning
low power
heuristic search
test cases
decision support system
decision making