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New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors.

Daniel MarienfeldEgor S. SogomonyanVitalij OcheretnijMichael Gössel
Published in: Asian Test Symposium (2005)
Keyphrases
  • neural network
  • wide range
  • least squares
  • input data
  • database
  • artificial intelligence
  • evolutionary algorithm