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BIST with negligible aliasing through random cover circuits.
T. Bogue
Helmut Jürgensen
Michael Gössel
Published in:
ASP-DAC (1995)
Keyphrases
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built in self test
high frequency
high speed
high resolution
uniformly distributed
randomly generated
low pass filtering
information systems
high quality
super resolution
real time
frequency domain
spatial resolution
light field