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Highly Efficient Test Response Compaction Using a Hierarchical X-Masking Technique.
Thomas Rabenalt
Michael Richter
Frank Poehl
Michael Gössel
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2012)
Keyphrases
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highly efficient
low cost
low complexity
hierarchical structure
test cases
low latency
high classification accuracy
data structure
evolutionary algorithm
sat solvers
gray code