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EM Fault Injection-Induced Clock Glitches: From Mechanism Analysis to Novel Sensor Design.

Roukoz NabhanJean-Max DutertreJean-Baptiste RigaudJean-Luc DangerLaurent Sauvage
Published in: IOLTS (2024)
Keyphrases
  • maximum likelihood
  • design process
  • fault injection
  • data mining
  • information systems
  • relational databases
  • query language
  • data processing