Login / Signup
Enhancing test efficiency for delay fault testing using multiple-clocked schemes.
Jing-Jia Liou
Li-C. Wang
Kwang-Ting Cheng
Jennifer Dworak
M. Ray Mercer
Rohit Kapur
Thomas W. Williams
Published in:
DAC (2002)
Keyphrases
</>
test cases
software testing
test data
test sequences
statistical tests
regression testing
website
neural network
test generation
highly efficient
test driven development
integration testing
fault model
testing process
failure modes
high speed
software engineering
computational complexity
information retrieval