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Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies.

Jennifer DworakMichael R. GrimailaSooryong LeeLi-C. WangM. Ray Mercer
Published in: ITC (1999)
Keyphrases
  • data sets
  • probability distribution
  • fault detection
  • neural network
  • three dimensional
  • fault diagnosis
  • steady state
  • evolutionary algorithm