Built-in Self-Repair in a 3D die stack using programmable logic.

Kundan Nepal Xi Shen Jennifer Dworak Theodore W. Manikas R. Iris Bahar

Published in: DFTS (2013)

Keyphrases

programmable logic
field programmable gate array
case study
data sets
databases
neural network
feature extraction
pattern recognition
probabilistic model
general purpose
higher order
fine grained
damage assessment