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Efficient Determination of Fault Criticality for Manufacturing Test Set Optimization.

Yiwen ShiKellie DiPalmaJennifer Dworak
Published in: DFT (2008)
Keyphrases
  • test set
  • error rate
  • training set
  • training data
  • test cases
  • test data
  • class distribution
  • data sets
  • support vector machine
  • fault detection
  • random selection