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Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis.
Nuno Alves
Yiwen Shi
Nicholas Imbriglia
Jennifer Dworak
Kundan Nepal
R. Iris Bahar
Published in:
ETS (2011)
Keyphrases
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test set
error rate
training set
random selection
low cost
training data
evaluation methodology
test data
test cases
computer vision
decision trees
high speed
class distribution
training and test sets
database
detection method
semi supervised
image processing