Login / Signup

Embedded Test for Low Cost Manufacturing.

Janusz RajskiNilanjan MukherjeeJerzy TyszerThomas Rinderknecht
Published in: VLSI Design (2004)
Keyphrases
  • low cost
  • embedded systems
  • real time
  • manufacturing systems
  • quality control
  • databases
  • expert systems
  • hardware and software
  • real world
  • genetic algorithm
  • computer vision
  • decision making
  • decision trees