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On the Generation of Compact Deterministic Test Sets for BIST Ready Designs.
Amit Kumar
Janusz Rajski
Sudhakar M. Reddy
Thomas Rinderknecht
Published in:
Asian Test Symposium (2013)
Keyphrases
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test set
error rate
training set
training data
test data
evaluation methodology
test cases
design principles
data sets
random selection
data mining
learning algorithm
learning process
support vector machine
semi supervised learning
training and test sets