Achieving High Test Quality with Reduced Pin Count Testing.
Jay JahangiriNilanjan MukherjeeWu-Tung ChengSubramanian MahadevanRon PressPublished in: Asian Test Symposium (2005)
Keyphrases
- achieving high
- code coverage
- test cases
- software testing
- test data
- reconstructed image quality
- test generation
- regression testing
- testing process
- test suite
- quality assurance
- test sequences
- high quality
- quality measures
- statistical tests
- number of test cases
- higher quality
- test case generation
- model based testing
- significantly reduced
- quality control
- software systems