Self-Checking Circuits versus Realistic Faults in Very Deep Submicron.
Lorena AnghelMichael NicolaidisIssam Alzaher-NoufalPublished in: VTS (2000)
Keyphrases
- vlsi circuits
- built in self test
- fault diagnosis
- real life
- fault models
- electron beam
- high speed
- real time
- analog circuits
- integrated circuit
- fault detection
- real world
- database
- analog vlsi
- digital circuits
- mixed signal
- learning algorithm
- high level synthesis
- data sets
- neural network
- logic synthesis
- three dimensional
- root cause
- deep learning
- website
- case study
- control system