Thierry Bonnoit

Publication Activity (10 Years)

Years Active: 2011-2018
Publications (10 Years): 4

Top Topics

Component Failures

Replicated Databases

Fault Tolerance

Top Venues

J. Electron. Test.

Publications

Thierry Bonnoit, Nacer-Eddine Zergainoh, Michael Nicolaidis
Reducing Rollback Cost in VLSI Circuits to Improve Fault Tolerance. IEEE Trans. Very Large Scale Integr. Syst. 26 (8) (2018)
Thierry Bonnoit, Fraidy Bouesse, Nacer-Eddine Zergainoh, Michael Nicolaidis
Designing reliable processor cores in ultimate CMOS and beyond: A double sampling solution. DATE (2018)
Thierry Bonnoit, Nacer-Eddine Zergainoh, Michael Nicolaidis, Raoul Velazco
Low cost rollback to improve fault-tolerance in VLSI circuits. LASCAS (2017)
Thierry Bonnoit, Alexandre Coelho, Nacer-Eddine Zergainoh, Raoul Velazco
SEU impact in processor's control-unit: Preliminary results obtained for LEON3 soft-core. LATS (2017)
Thierry Bonnoit, Dominique Morche, Cedric Dehos, Emeric de Foucauld
Robust BER estimator for DBPSK modulation. NEWCAS (2014)
Thierry Bonnoit, Michael Nicolaidis, Nacer-Eddine Zergainoh
Using Error Correcting Codes Without Speed Penalty in Embedded Memories: Algorithm, Implementation and Case Study. J. Electron. Test. 29 (3) (2013)
Michael Nicolaidis, Thierry Bonnoit, Nacer-Eddine Zergainoh
Eliminating speed penalty in ECC protected memories. DATE (2011)
Thierry Bonnoit, Michael Nicolaidis, Nacer-Eddine Zergainoh
Towards a tool for implementing delay-free ECC in embedded memories. ICCD (2011)