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Novel built-in methodology for defect testing of capacitor oxide in SAR analog to digital converters for critical automotive applications.
Vezio Malandruccolo
Mauro Ciappa
Wolfgang Fichtner
Hubert Rothleitner
Published in:
ETS (2010)
Keyphrases
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metal oxide
circuit design
synthetic aperture radar
mixed signal
sar images
solid state
printed circuit
cmos image sensor
test cases
automotive industry
data conversion
transmission line
multi channel
image processing
sar imagery
low power
model based testing
sigma delta
image reconstruction
high speed