Maria Stangoni

Publication Activity (10 Years)

Years Active: 2002-2011
Publications (10 Years): 0

Publications

Mauro Ciappa, Luigi Mangiacapra, Maria Stangoni, Stephan Ott, Wolfgang Fichtner
Design of optimum electron beam irradiation processes for the reliability of electric cables used in critical applications. Microelectron. Reliab. 51 (9-11) (2011)
Mauro Ciappa, Luigi Mangiacapra, Maria Stangoni, Stephan Ott, Wolfgang Fichtner
Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulation. Microelectron. Reliab. 49 (9-11) (2009)
Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
Assessment of the Analytical Capabilities of Scanning Capacitance and Scanning Spreading Resistance Microscopy Applied to Semiconductor Devices. Microelectron. Reliab. 45 (9-11) (2005)
Marco Buzzo, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner
Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast. Microelectron. Reliab. 45 (9-11) (2005)
Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner, Elisa Ricci, Andrea Scorzoni
On the Use of Neural Networks to Solve the Reverse Modelling Problem for the Quantification of Dopant Profiles Extracted by Scanning Probe Microscopy Techniques. Microelectron. Reliab. 44 (9-11) (2004)
Marco Buzzo, Markus Leicht, Thomas Schweinböck, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner
N Junction by Scanning Capacitance and Scanning Electron Microscopy. Microelectron. Reliab. 44 (9-11) (2004)
Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
A New Procedure to Define the Zero-Field Condition and to Delineate pn-Junctions in Silicon Devices by Scanning Capacitance Microscopy. Microelectron. Reliab. 43 (9-11) (2003)
Giovanna Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. Microelectron. Reliab. 43 (9-11) (2003)
Maria Stangoni, Mauro Ciappa, Marco Buzzo, Markus Leicht, Wolfgang Fichtner
Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction. Microelectron. Reliab. 42 (9-11) (2002)