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Robustness test and failure analysis of IGBT modules during turn-off.

Jesús Urresti-IbañezAlberto CastellazziM. PitonJosé RebolloMichel Mermet-GuyennetMauro Ciappa
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • artificial intelligence
  • image analysis
  • information systems
  • decision trees
  • statistical analysis
  • static analysis