Login / Signup
Measurement of the transient junction temperature in MOSFET devices under operating conditions.
Davide Barlini
Mauro Ciappa
Michel Mermet-Guyennet
Wolfgang Fichtner
Published in:
Microelectron. Reliab. (2007)
Keyphrases
</>
operating conditions
steady state
heat exchanger
markov chain
high voltage
input signals
fault diagnosis
control strategy
measured data
matlab simulink
dc motor
loading conditions
artificial intelligence
decision making