A new two-dimensional TCAD model for threshold instability in silicon carbide MOSFETs.

Takuo Kikuchi Mauro Ciappa

Published in: Microelectron. Reliab. (2013)

Keyphrases

low cost
computational model
mathematical model
probabilistic model
three dimensional
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real time
knowledge base
objective function
prior knowledge
high speed
process model
statistical model
conceptual model