Giuseppe Croce

Publication Activity (10 Years)

Years Active: 2001-2022
Publications (10 Years): 5

Top Topics

Integrated Circuit

Generation Process

Top Venues

Microelectron. Reliab.

Publications

Giuseppe Croce
Non Volatile Memory in Advanced Smart Power technology: product requirements and integration solutions. IMW (2022)
Andrea Natale Tallarico, Susanna Reggiani, Riccardo Depetro, Giuseppe Croce, Enrico Sangiorgi, Claudio Fiegna
Full Understanding of Hot Electrons and Hot/Cold Holes in the Degradation of p-channel Power LDMOS Transistors. IRPS (2020)
Federico Giuliano, Riccardo Depetro, Giuseppe Croce, Andrea Natale Tallarico, Susanna Reggiani, Antonio Gnudi, Enrico Sangiorgi, Claudio Fiegna, Mattia Rossetti, Antonio Molfese, Stefano Manzini
TCAD predictions of hot-electron injection in p-type LDMOS transistors. ESSDERC (2019)
Susanna Reggiani, Mattia Rossetti, Antonio Gnudi, Andrea Natale Tallarico, Antonio Molfese, Stefano Manzini, Riccardo Depetro, Giuseppe Croce, Enrico Sangiorgi, Claudio Fiegna
TCAD investigation on hot-electron injection in new-generation technologies. Microelectron. Reliab. (2018)
Andrea Natale Tallarico, Susanna Reggiani, Paolo Magnone, Giuseppe Croce, Riccardo Depetro, P. Gattari, Enrico Sangiorgi, Claudio Fiegna
Investigation of the hot carrier degradation in power LDMOS transistors with customized thick oxide. Microelectron. Reliab. (2017)
Gaudenzio Meneghesso, N. Novembre, Enrico Zanoni, Luca Sponton, Lorenzo Cerati, Giuseppe Croce
Optimization of ESD protection structures suitable for BCD6 smart power technology. Microelectron. Reliab. 43 (9-11) (2003)
Luca Sponton, Lorenzo Cerati, Giuseppe Croce, Giovanna Mura, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. Microelectron. Reliab. 42 (9-11) (2002)
Luca Sponton, Lorenzo Cerati, Giuseppe Croce, Francesco Chrappan, Claudio Contiero, Gaudenzio Meneghesso, Enrico Zanoni
ESD protection structures for BCD5 smart power technologies. Microelectron. Reliab. 41 (9-10) (2001)