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Investigation of the hot carrier degradation in power LDMOS transistors with customized thick oxide.

Andrea Natale TallaricoSusanna ReggianiPaolo MagnoneGiuseppe CroceRiccardo DepetroP. GattariEnrico SangiorgiClaudio Fiegna
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • power consumption
  • high power
  • low power
  • high density
  • integrated circuit
  • power management
  • real world
  • machine learning
  • steady state
  • field effect transistors
  • electron microscopy
  • fuel cell