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TCAD predictions of hot-electron injection in p-type LDMOS transistors.

Federico GiulianoRiccardo DepetroGiuseppe CroceAndrea Natale TallaricoSusanna ReggianiAntonio GnudiEnrico SangiorgiClaudio FiegnaMattia RossettiAntonio MolfeseStefano Manzini
Published in: ESSDERC (2019)
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