TCAD investigation on hot-electron injection in new-generation technologies.
Susanna ReggianiMattia RossettiAntonio GnudiAndrea Natale TallaricoAntonio MolfeseStefano ManziniRiccardo DepetroGiuseppe CroceEnrico SangiorgiClaudio FiegnaPublished in: Microelectron. Reliab. (2018)