Login / Signup
High brightness GaN LEDs degradation during dc and pulsed stress.
Matteo Meneghini
Simona Podda
A. Morelli
Ruggero Pintus
L. Trevisanello
Gaudenzio Meneghesso
Massimo Vanzi
Enrico Zanoni
Published in:
Microelectron. Reliab. (2006)
Keyphrases
</>
optical flow
wide range
high levels
databases
data sets
neural network
artificial intelligence
social networks
database systems
color images