Sign in

A specimen-current branching approach for FA of long Electromigration test lines.

C. CaprileIlaria De MunariMaurizio ImprontaSimona PoddaAndrea ScorzoniMassimo Vanzi
Published in: Microelectron. Reliab. (2002)
Keyphrases
  • real time
  • databases
  • machine learning
  • artificial intelligence
  • image processing
  • image segmentation
  • mobile robot
  • hough transform
  • search tree
  • future development