PHOTOMETRIC STEREO
Experts
- Edwin R. Hancock
- Yasuyuki Matsushita
- Ravi Ramamoorthi
- Boxin Shi
- Paul E. Debevec
- Roberto Cipolla
- Katsushi Ikeuchi
- Hans-Peter Seidel
- Luc Van Gool
- Hiroshi Kawasaki
- William A. P. Smith
- Shree K. Nayar
- Junyu Dong
- Imari Sato
- Daniel Cremers
- Roberto Mecca
- Melvyn L. Smith
- Ryo Furukawa
- Ping Tan
- Ko Nishino
- Yvain Quéau
- Aly A. Farag
- Yoichi Sato
- David J. Kriegman
- Takahiro Okabe
- Michael Breuß
- Jean-Denis Durou
- Abhijeet Ghosh
- Pieter Peers
- Zhan Song
- Jianguang Wen
- Hendrik P. A. Lensch
- Kalyan Sunkavalli
- Shunlin Liang
- Christian Theobalt
- Marc Pollefeys
- Long Quan
- Qing Xiao
- Pascal Fua
Venues
- CoRR
- CVPR
- Sensors
- Remote. Sens.
- IGARSS
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP
- ACM Trans. Graph.
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Graph. Forum
- ICRA
- IEEE Access
- BMVC
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Image Process.
- Int. J. Comput. Vis.
- IROS
- Pattern Recognit.
- ICPR
- Image Vis. Comput.
- 3DV
- Comput. Graph.
- CVPR Workshops
- Comput. Vis. Image Underst.
- Vis. Comput.
- Comput. Aided Des.
- EMBC
- MVA
- IEEE Trans. Vis. Comput. Graph.
- WACV
- IEEE Geosci. Remote. Sens. Lett.
- ICASSP
- ICCV Workshops
- Mach. Vis. Appl.
- SIGGRAPH Posters
- Pattern Recognit. Lett.
- J. Electronic Imaging
- Comput. Aided Geom. Des.
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