PHOTOMETRIC STEREO
Experts
- Edwin R. Hancock
- Yasuyuki Matsushita
- Ravi Ramamoorthi
- Boxin Shi
- Paul E. Debevec
- Roberto Cipolla
- Katsushi Ikeuchi
- Hans-Peter Seidel
- William A. P. Smith
- Hiroshi Kawasaki
- Luc Van Gool
- Shree K. Nayar
- Junyu Dong
- Imari Sato
- Daniel Cremers
- Ryo Furukawa
- Roberto Mecca
- Melvyn L. Smith
- Ko Nishino
- Ping Tan
- Aly A. Farag
- David J. Kriegman
- Takahiro Okabe
- Yvain Quéau
- Yoichi Sato
- Michael Breuß
- Jean-Denis Durou
- Abhijeet Ghosh
- Pieter Peers
- Zhan Song
- Jianguang Wen
- Hendrik P. A. Lensch
- Kalyan Sunkavalli
- Christian Theobalt
- Marc Pollefeys
- Shunlin Liang
- Long Quan
- Qing Xiao
- Koichiro Deguchi
Venues
- CoRR
- Sensors
- CVPR
- Remote. Sens.
- IGARSS
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP
- ACM Trans. Graph.
- IEEE Trans. Geosci. Remote. Sens.
- ICRA
- Comput. Graph. Forum
- IEEE Access
- BMVC
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Image Process.
- Int. J. Comput. Vis.
- IROS
- Pattern Recognit.
- 3DV
- ICPR
- Comput. Graph.
- Image Vis. Comput.
- Vis. Comput.
- Comput. Vis. Image Underst.
- CVPR Workshops
- IEEE Trans. Vis. Comput. Graph.
- Comput. Aided Des.
- WACV
- EMBC
- MVA
- ICASSP
- IEEE Geosci. Remote. Sens. Lett.
- ICCV Workshops
- Mach. Vis. Appl.
- Comput. Aided Geom. Des.
- Multim. Tools Appl.
- IEEE Robotics Autom. Lett.
- AAAI
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