SURFACE NORMALS
Experts
- Edwin R. Hancock
- Yasuyuki Matsushita
- Roberto Cipolla
- William A. P. Smith
- Boxin Shi
- Katsushi Ikeuchi
- Roberto Mecca
- Michael Breuß
- Melvyn L. Smith
- Junyu Dong
- Jean-Denis Durou
- Luc Van Gool
- Yvain Quéau
- Daniel Cremers
- Paul E. Debevec
- Aly A. Farag
- Ping Tan
- Ravi Ramamoorthi
- Gary A. Atkinson
- Imari Sato
- David J. Kriegman
- Yuji Iwahori
- Osamu Ikeda
- Philip L. Worthington
- Hans-Peter Seidel
- Lyndon N. Smith
- Ryszard Kozera
- Mario Castelán
- Pieter Peers
- Alfred M. Bruckstein
- Yoichi Sato
- Antonio Robles-Kelly
- Hong Qin
- Fotios Logothetis
- Kwan-Yee K. Wong
- Lin Qi
- Michael Goesele
- Long Quan
- Koichiro Deguchi
Venues
- CoRR
- CVPR
- Sensors
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- Remote. Sens.
- Comput. Graph. Forum
- IGARSS
- BMVC
- Int. J. Comput. Vis.
- ICIP
- ACM Trans. Graph.
- ICRA
- Comput. Aided Geom. Des.
- Comput. Aided Des.
- Pattern Recognit.
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Vis. Image Underst.
- IEEE Access
- ICPR
- Comput. Graph.
- Vis. Comput.
- IROS
- Image Vis. Comput.
- MVA
- IEEE Trans. Instrum. Meas.
- 3DV
- Pattern Recognit. Lett.
- IEEE Trans. Image Process.
- ICPR (1)
- IEEE Geosci. Remote. Sens. Lett.
- Systems and Computers in Japan
- SIGGRAPH
- ICIP (2)
- IEEE Trans. Vis. Comput. Graph.
- VMV
- ECCV (2)
- J. Math. Imaging Vis.
- WACV
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