LIGHT SOURCE
Experts
- Edwin R. Hancock
- Katsushi Ikeuchi
- Yasuyuki Matsushita
- Ravi Ramamoorthi
- William A. P. Smith
- Boxin Shi
- Luc Van Gool
- Hiroshi Kawasaki
- Paul E. Debevec
- Junyu Dong
- Roberto Cipolla
- Imari Sato
- Hans-Peter Seidel
- Takahiro Okabe
- Aly A. Farag
- Melvyn L. Smith
- Shree K. Nayar
- Zhan Song
- Dimitris Samaras
- Yoichi Sato
- Pieter Peers
- Michael Breuß
- Ko Nishino
- Stephen Lin
- David J. Kriegman
- Roberto Mecca
- Ryo Furukawa
- Jean-Denis Durou
- Jan Kautz
- Kalyan Sunkavalli
- Hujun Bao
- Jianguang Wen
- Ruigang Yang
- William T. Freeman
- Peter N. Belhumeur
- Christian Theobalt
- Jonathan T. Barron
- Daniel Cremers
- Todd E. Zickler
Venues
- CoRR
- CVPR
- Sensors
- ICIP
- Remote. Sens.
- IEEE Access
- ICCV
- IGARSS
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Graph. Forum
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Image Process.
- ACM Trans. Graph.
- ICRA
- BMVC
- ICPR
- Pattern Recognit.
- ICASSP
- Multim. Tools Appl.
- IROS
- Int. J. Comput. Vis.
- Vis. Comput.
- CVPR Workshops
- IEEE Trans. Instrum. Meas.
- WACV
- Comput. Vis. Image Underst.
- J. Electronic Imaging
- Image Vis. Comput.
- IEEE Trans. Vis. Comput. Graph.
- MVA
- ACM Multimedia
- Pattern Recognit. Lett.
- Neurocomputing
- 3DV
- SIGGRAPH Posters
- AAAI
- IET Image Process.
- J. Vis. Commun. Image Represent.
- ICME
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