SURFACE INSPECTION
Experts
- Melvyn L. Smith
- Lyndon N. Smith
- Yasuyuki Matsushita
- Boxin Shi
- Roberto Cipolla
- Roberto Mecca
- Yuxiang Yang
- Mingyu Gao
- Daniel F. García
- Wenming Lin
- Maria Petrou
- Fotios Logothetis
- Robert M. Haralick
- Thomas O. Binford
- Paul O'Leary
- Du-Ming Tsai
- Ernst D. Dickmanns
- Rubén Usamentiaga
- Marcos Portabella
- Ignas Budvytis
- Yvain Quéau
- Linda G. Shapiro
- Xuewu Zhang
- Yunhui Yan
- Perfecto Mariño
- Yu-Wing Tai
- Roger Y. Tsai
- Alfred M. Bruckstein
- Yang Zhang
- Jorge L. C. Sanz
- Julio Molleda
- Francisco G. Bulnes
- Zhiwei He
- In So Kweon
- Emilio Martínez Expósito
- Paulo F. U. Gotardo
- Ad Stoffelen
- Gang Liu
- Yaonan Wang
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- MVA
- BMVC
- IEEE Access
- Comput. Electron. Agric.
- Mach. Vis. Appl.
- Comput. Ind.
- Image Vis. Comput.
- ICRA
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICMV
- J. Electronic Imaging
- Expert Syst. Appl.
- Int. J. Comput. Vis.
- Bioinform.
- Multim. Tools Appl.
- IROS
- M2VIP
- Neural Comput. Appl.
- Image Processing: Machine Vision Applications
- Pattern Recognit.
- J. Intell. Fuzzy Syst.
- J. Intell. Manuf.
- J. Sensors
- ICIA
- ICIP
- Pattern Recognit. Lett.
- CASE
- ISCAS
- IEA/AIE
- Int. J. Pattern Recognit. Artif. Intell.
- Digital Mammography / IWDM
- J. Digit. Imaging
- ICCV
- Remote. Sens.
- Adv. Intell. Syst.
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