SURFACE INSPECTION
Experts
- Melvyn L. Smith
- Lyndon N. Smith
- Yasuyuki Matsushita
- Boxin Shi
- Roberto Mecca
- Roberto Cipolla
- Mingyu Gao
- Daniel F. GarcÃa
- Yuxiang Yang
- Fotios Logothetis
- Robert M. Haralick
- Wenming Lin
- Maria Petrou
- Ernst D. Dickmanns
- Du-Ming Tsai
- Xuewu Zhang
- Yvain Quéau
- Linda G. Shapiro
- Ignas Budvytis
- Rubén Usamentiaga
- Marcos Portabella
- Thomas O. Binford
- Paul O'Leary
- Jean-François Lalonde
- Miguel SantamarÃa Sánchez
- Yunhui Yan
- Emilio MartÃnez Expósito
- Yang Zhang
- Julio Molleda
- Dan Berco
- Yu-Wing Tai
- Alfred M. Bruckstein
- Ping Tan
- Yaonan Wang
- Kechen Song
- Chi-Keung Tang
- Paulo F. U. Gotardo
- Gang Liu
- Roger Y. Tsai
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- BMVC
- MVA
- Comput. Electron. Agric.
- Mach. Vis. Appl.
- Comput. Ind.
- ICRA
- Image Vis. Comput.
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICMV
- Expert Syst. Appl.
- J. Electronic Imaging
- Int. J. Comput. Vis.
- Multim. Tools Appl.
- Bioinform.
- M2VIP
- IROS
- Neural Comput. Appl.
- Image Processing: Machine Vision Applications
- J. Intell. Manuf.
- J. Intell. Fuzzy Syst.
- Pattern Recognit.
- ICIA
- J. Sensors
- IEEE Trans. Intell. Transp. Syst.
- ICIP
- Remote. Sens.
- ISCAS
- Int. J. Pattern Recognit. Artif. Intell.
- CASE
- WACV
- Robotics Comput. Integr. Manuf.
- J. Digit. Imaging
- Digital Mammography / IWDM
- Pattern Recognit. Lett.
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