DIFFUSE REFLECTANCE
Experts
- Paul E. Debevec
- Abhijeet Ghosh
- Pieter Peers
- Graham Fyffe
- Ko Nishino
- Katsushi Ikeuchi
- Jonathan T. Barron
- Shree K. Nayar
- Borom Tunwattanapong
- Christoph Busch
- Takayuki Okatani
- Xiuming Zhang
- Chu-Tak Li
- Li-Wen Wang
- Zhi-Song Liu
- Boyang Deng
- Pratul P. Srinivasan
- Koichiro Deguchi
- Jag Mohan Singh
- Raghavendra Ramachandra
- Kiran B. Raja
- Reinhard Klein
- Gilles Pitard
- Stamatios Georgoulis
- Stephen Lombardi
- Jan-Peter Muller
- Xin Tong
- Jan Meseth
- Michael S. Langer
- Yasuyuki Matsushita
- Haruo Takemura
- Takashi Matsuyama
- Giuseppe Claudio Guarnera
- Edwin R. Hancock
- Fredric Solomon
- Crystal Barker Schaaf
- Kristin J. Dana
- Toshikazu Wada
- Imari Sato
Venues
- CoRR
- CVPR
- Remote. Sens.
- Sensors
- ICCV
- ACM Trans. Graph.
- IGARSS
- IEEE Trans. Pattern Anal. Mach. Intell.
- 3DV
- EMBC
- Comput. Graph. Forum
- Comput. Electron. Agric.
- IEEE Trans. Geosci. Remote. Sens.
- BMVC
- Rendering Techniques
- Comput. Vis. Image Underst.
- SIGGRAPH Posters
- Comput. Graph.
- SIGGRAPH Talks
- CIC
- MVA
- ICIP
- IEEE Computer Graphics and Applications
- IEEE Geosci. Remote. Sens. Lett.
- Measuring, Modeling, and Reproducing Material Appearance
- CVPR (1)
- ICPR
- IEEE Trans. Instrum. Meas.
- CGIV
- Comput. Aided Des.
- ICPR (1)
- IEEE Trans. Vis. Comput. Graph.
- IROS
- IEEE Trans. Image Process.
- ICASSP
- WACV
- SIGGRAPH
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- VISAPP (1)
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