DIFFUSE REFLECTANCE
Experts
- Paul E. Debevec
- Abhijeet Ghosh
- Pieter Peers
- Graham Fyffe
- Ko Nishino
- Katsushi Ikeuchi
- Jonathan T. Barron
- Shree K. Nayar
- Xiuming Zhang
- Boyang Deng
- Chu-Tak Li
- Zhi-Song Liu
- Christoph Busch
- Kiran B. Raja
- Jag Mohan Singh
- Raghavendra Ramachandra
- Borom Tunwattanapong
- Takayuki Okatani
- Koichiro Deguchi
- Li-Wen Wang
- Reinhard Klein
- Pratul P. Srinivasan
- Osamu Ikeda
- Narendra Ahuja
- Yuji Iwahori
- Ron Kimmel
- Toshikazu Wada
- Takashi Matsuyama
- Giuseppe Claudio Guarnera
- Gilles Pitard
- Michael S. Langer
- Jan-Peter Muller
- Haruo Takemura
- Jan J. Koenderink
- Alamin Mansouri
- Stamatios Georgoulis
- Edwin R. Hancock
- Michael Weinmann
- Jan Meseth
Venues
- CoRR
- CVPR
- Remote. Sens.
- Sensors
- ICCV
- IGARSS
- ACM Trans. Graph.
- IEEE Trans. Pattern Anal. Mach. Intell.
- 3DV
- Comput. Graph. Forum
- EMBC
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Electron. Agric.
- Comput. Graph.
- SIGGRAPH Posters
- SIGGRAPH Talks
- Rendering Techniques
- BMVC
- Comput. Vis. Image Underst.
- MVA
- CIC
- ICIP
- IEEE Geosci. Remote. Sens. Lett.
- Comput. Aided Des.
- IROS
- Measuring, Modeling, and Reproducing Material Appearance
- IEEE Computer Graphics and Applications
- CVPR (1)
- IEEE Trans. Vis. Comput. Graph.
- CGIV
- ICPR (1)
- ICPR
- IEEE Trans. Instrum. Meas.
- J. Imaging
- ICRA
- VISAPP (1)
- Vis. Comput.
- ICCP
- IGARSS (3)
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