DIFFUSE REFLECTANCE
Experts
- Paul E. Debevec
- Abhijeet Ghosh
- Graham Fyffe
- Pieter Peers
- Ko Nishino
- Katsushi Ikeuchi
- Shree K. Nayar
- Jonathan T. Barron
- Pratul P. Srinivasan
- Reinhard Klein
- Koichiro Deguchi
- Li-Wen Wang
- Takayuki Okatani
- Borom Tunwattanapong
- Kiran B. Raja
- Raghavendra Ramachandra
- Jag Mohan Singh
- Christoph Busch
- Zhi-Song Liu
- Boyang Deng
- Chu-Tak Li
- Xiuming Zhang
- Kristin J. Dana
- Stephen Lombardi
- William T. Freeman
- Xin Tong
- Fredric Solomon
- Imari Sato
- Crystal Barker Schaaf
- Paul Graham
- Qinhuo Liu
- Stefanos Zafeiriou
- Yasuyuki Matsushita
- Gaëtan Le Goïc
- Jan Meseth
- Luc Van Gool
- Edwin R. Hancock
- Stamatios Georgoulis
- Michael Weinmann
Venues
- CoRR
- CVPR
- Remote. Sens.
- Sensors
- ICCV
- IGARSS
- ACM Trans. Graph.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Graph. Forum
- 3DV
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Electron. Agric.
- EMBC
- SIGGRAPH Talks
- Rendering Techniques
- BMVC
- Comput. Vis. Image Underst.
- Comput. Graph.
- SIGGRAPH Posters
- ICIP
- MVA
- CIC
- IEEE Computer Graphics and Applications
- ICPR (1)
- ICPR
- CVPR (1)
- IEEE Trans. Vis. Comput. Graph.
- CGIV
- IEEE Trans. Instrum. Meas.
- IEEE Geosci. Remote. Sens. Lett.
- Comput. Aided Des.
- IROS
- Measuring, Modeling, and Reproducing Material Appearance
- Int. J. Appl. Earth Obs. Geoinformation
- ECCV (4)
- Mach. Vis. Appl.
- IAS
- ICASSP
- SITIS
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