DIFFUSE REFLECTANCE
Experts
- Paul E. Debevec
- Abhijeet Ghosh
- Pieter Peers
- Graham Fyffe
- Ko Nishino
- Katsushi Ikeuchi
- Shree K. Nayar
- Jonathan T. Barron
- Raghavendra Ramachandra
- Takayuki Okatani
- Xiuming Zhang
- Christoph Busch
- Chu-Tak Li
- Boyang Deng
- Pratul P. Srinivasan
- Kiran B. Raja
- Zhi-Song Liu
- Reinhard Klein
- Li-Wen Wang
- Jag Mohan Singh
- Borom Tunwattanapong
- Koichiro Deguchi
- Yasuyuki Matsushita
- Kristin J. Dana
- Crystal Barker Schaaf
- Imari Sato
- Toshikazu Wada
- Xin Tong
- Ron Kimmel
- Michael S. Langer
- Alamin Mansouri
- Gilles Pitard
- Stefanos Zafeiriou
- Edwin R. Hancock
- Stamatios Georgoulis
- Gaëtan Le Goïc
- Narendra Ahuja
- Fredric Solomon
- Paul Graham
Venues
- CoRR
- CVPR
- Remote. Sens.
- Sensors
- ICCV
- ACM Trans. Graph.
- IGARSS
- IEEE Trans. Pattern Anal. Mach. Intell.
- 3DV
- Comput. Graph. Forum
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Electron. Agric.
- EMBC
- SIGGRAPH Talks
- Comput. Graph.
- Comput. Vis. Image Underst.
- SIGGRAPH Posters
- BMVC
- Rendering Techniques
- CIC
- ICIP
- MVA
- ICPR
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Vis. Comput. Graph.
- Comput. Aided Des.
- ICPR (1)
- IEEE Computer Graphics and Applications
- CVPR (1)
- CGIV
- IROS
- IEEE Geosci. Remote. Sens. Lett.
- Measuring, Modeling, and Reproducing Material Appearance
- Vis. Comput.
- Image Vis. Comput.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- IAS
- CGIV/MCS
- ACCV (1)
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