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Experts
- Katsushi Ikeuchi
- Roberto Cipolla
- Ramesh Raskar
- Edwin R. Hancock
- Sunil Hadap
- Shinsaku Hiura
- Zhi-Song Liu
- Chu-Tak Li
- Imari Sato
- Yoichi Sato
- Li-Wen Wang
- Maria Petrou
- Xiaochun Cao
- Takahiro Okabe
- Ryszard Kozera
- Andrew Blake
- Alfred M. Bruckstein
- David J. Kriegman
- Michael S. Langer
- Ko Nishino
- Sabine Süsstrunk
- Eugene Fiume
- Philippe Bekaert
- Kosuke Sato
- Tetsuya Miki
- Naoto Kishi
- Yuji Iwahori
- Matthew A. Turk
- Yueping Cai
- Mubarak Shah
- Nelson L. Max
- Pauli Fält
- Fredric Solomon
- Shree K. Nayar
- Hans-Peter Seidel
- Junyu Dong
- Eiji Oki
- Tongbo Chen
- Rogério Schmidt Feris
Venues
- CoRR
- CVPR
- Sensors
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICRA
- Comput. Graph. Forum
- Remote. Sens.
- Mach. Vis. Appl.
- IEEE Access
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- ICIP
- OFC
- Comput. Vis. Image Underst.
- ICPR (1)
- CVPR Workshops
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- Comput. Graph.
- Int. J. Comput. Vis.
- IEICE Trans. Electron.
- IEICE Electron. Express
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- ACM Trans. Graph.
- ICPR
- Color Imaging Conference
- IEEE Visualization
- Multim. Tools Appl.
- SIGGRAPH Posters
- BMVC
- IEEE Trans. Image Process.
- ECCV Workshops (3)
- IEEE Trans. Vis. Comput. Graph.
- Displays
- Pattern Recognit. Lett.
- VISAPP (1)
- ICTON
- EMBC
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