SPECULAR HIGHLIGHTS
Experts
- Katsushi Ikeuchi
- Edwin R. Hancock
- Ramesh Raskar
- Roberto Cipolla
- Shinsaku Hiura
- Imari Sato
- Zhi-Song Liu
- Takahiro Okabe
- Chu-Tak Li
- Xiaochun Cao
- Li-Wen Wang
- Yoichi Sato
- Sunil Hadap
- Maria Petrou
- Tetsuya Miki
- Nelson L. Max
- Matthew A. Turk
- Yueping Cai
- Kar-Han Tan
- Pauli Fält
- Naoto Kishi
- Sabine Süsstrunk
- Eugene Fiume
- Kosuke Sato
- Andrew Blake
- Junyu Dong
- Michael S. Langer
- David J. Kriegman
- Motoharu Matsuura
- Ko Nishino
- Yuji Iwahori
- Mubarak Shah
- Shree K. Nayar
- Hans-Peter Seidel
- Alfred M. Bruckstein
- Philippe Bekaert
- Tongbo Chen
- Eiji Oki
- Rogério Schmidt Feris
Venues
- CoRR
- CVPR
- Sensors
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Graph. Forum
- ICRA
- Remote. Sens.
- IEEE Access
- Vis. Comput.
- Mach. Vis. Appl.
- MVA
- Comput. Vis. Image Underst.
- OFC
- ICPR (1)
- CVPR Workshops
- ICIP
- ICPR
- Int. J. Comput. Vis.
- SIGGRAPH Posters
- Color Imaging Conference
- ACM Trans. Graph.
- Multim. Tools Appl.
- CVPR (2)
- IEICE Electron. Express
- IEICE Trans. Electron.
- WACV
- CIC
- Comput. Graph.
- IEEE Visualization
- ICTON
- VISAPP (1)
- IEEE Trans. Geosci. Remote. Sens.
- CVPR (1)
- EMBC
- Displays
- IEEE Trans. Image Process.
- IROS
- 3DV
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