Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics.
Nicola WrachienNicolò LagoAntonio RizzoRiccardo D'AlpaosAndrea StefaniGuido TurattiMichele MucciniGaudenzio MeneghessoAndrea CesterPublished in: Microelectron. Reliab. (2015)