Nicolò Lago

Publication Activity (10 Years)

Years Active: 2014-2024
Publications (10 Years): 6

Top Topics

Equivalent Circuit

Defeasible Logic

Top Venues

Microelectron. Reliab.

IEEE Trans. Instrum. Meas.

MetroInd4.0&IoT

Publications

Sarah Tonello, Alberto Zacchini, Alessandra Galli, Ata Golparvar, Ali Meimandi, Giacomo Peruzzi, Alessandro Pozzebon, Nicolò Lago, Andrea Cester, Giada Giorgi, Sandro Carrara, Claudio Narduzzi
Design and in vitro Characterization of a Wearable Multisensing System for Hydration Monitoring. IEEE Trans. Instrum. Meas. 73 (2024)
Nicolò Lago, Sara Ruiz Molina, Marta Mas Torrent, Stefano Casalini, Andrea Cester
Signal amplification properties of Electrolyte-Gated Organic Field-Effect Transistors. MetroInd4.0&IoT (2023)
Alessandra Galli, Nicolò Lago, Sarah Tonello, Mario Bortolozzi, Marco Buonomo, Morten Gram Pedersen, Andrea Cester, Giada Giorgi
A Morphological Peak-Detector for Single-Unit Neural Recording Acquisition Systems. IEEE Trans. Instrum. Meas. 71 (2022)
Marco Buonomo, Nicola Wrachien, Nicolò Lago, Giuseppe Cantarella, Andrea Cester
flexible TFTs. Microelectron. Reliab. (2018)
Nicola Wrachien, Nicolò Lago, Antonio Rizzo, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini, Gaudenzio Meneghesso, Andrea Cester
Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics. Microelectron. Reliab. 55 (9-10) (2015)
Andrea Cester, Antonio Rizzo, A. Bazzega, Nicolò Lago, J. Favaro, Marco Barbato, Nicola Wrachien, Suren A. Gevorgyan, Michael Corazza, Frederik C. Krebs
Effects of constant voltage and constant current stress in PCBM: P3HT solar cells. Microelectron. Reliab. 55 (9-10) (2015)
Nicola Wrachien, Andrea Cester, Nicolò Lago, Gaudenzio Meneghesso, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini
Effects of constant voltage stress on organic complementary logic inverters. ESSDERC (2014)
Nicola Wrachien, Andrea Cester, Nicolò Lago, Gaudenzio Meneghesso, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini
Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states. Microelectron. Reliab. 54 (9-10) (2014)