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Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure.

Nicola WrachienDaniel BariJaroslav KovácJan JakabovicDaniel DonovalGaudenzio MeneghessoAndrea Cester
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • visible light
  • infrared images
  • face recognition
  • infrared
  • infrared imagery
  • image sensor
  • information systems