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Characterization of high-voltage charge-trapping effects in GaN-based power HEMTs.

Davide BisiAntonio StoccoMatteo MeneghiniFabiana RampazzoAndrea CesterGaudenzio MeneghessoEnrico Zanoni
Published in: ESSDERC (2014)
Keyphrases
  • high voltage
  • operating conditions
  • normal operation
  • power consumption
  • steady state
  • partial discharge
  • learning algorithm
  • artificial intelligence
  • decision trees
  • input image
  • supervised learning