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Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures.

Marco BarbatoAndrea CesterViviana MulloniB. MargesinGiorgio De PasqualeAurelio SomàGaudenzio Meneghesso
Published in: ESSDERC (2014)
Keyphrases
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  • multiscale
  • video sequences
  • radio frequency
  • reliability analysis