H. W. Chen

Publication Activity (10 Years)

Years Active: 2010-2019
Publications (10 Years): 1

Top Topics

Silicon Dioxide

Top Venues

Publications

E. R. Hsieh, C. W. Chang, C. C. Chuang, H. W. Chen, Steve S. Chung
The Demonstration of Gate Dielectric-fuse 4kb OTP Memory Feasible for Embedded Applications in High-k Metal-gate CMOS Generations and Beyond. VLSI Circuits (2019)
H. W. Chen, C. H. Liu
Impact of Hf content on positive bias temperature instability reliability of HfSiON gate dielectrics. Microelectron. Reliab. 50 (5) (2010)
C. H. Liu, H. W. Chen
Electrical characteristics and reliability properties of metal-oxide-semiconductor capacitors with HfZrLaO gate dielectrics. Microelectron. Reliab. 50 (5) (2010)