Steve S. Chung

Publication Activity (10 Years)

Years Active: 1999-2023
Publications (10 Years): 9

Top Topics

Power Reduction

Highly Reliable

Design Methodology

Top Venues

VLSI Technology and Circuits

Publications

Tiancheng Gong, Lihua Xu, Wei Wei, Pengfei Jiang, Peng Yuan, Bowen Nie, Yuanquan Huang, Yuan Wang, Yang Yang, Jianfeng Gao, Junfeng Li, Jun Luo, Lingfei Wang, Jianguo Yang, Qing Luo, Ling Li, Steve S. Chung, Ming Liu
First Demonstration of a Design Methodology for Highly Reliable Operation at High Temperature on 128kb 1T1C FeRAM Chip. VLSI Technology and Circuits (2023)
M. Y. Li, J. P. Lee, C. H. Liu, J. C. Guo, Steve S. Chung
Endurance and Excellent Retention. IRPS (2023)
E. R. Hsieh, J. K. Chang, T. Y. Tang, Y. J. Li, C. W. Liang, M. Y. Lin, S. Y. Huang, C. J. Su, J. C. Guo, Steve S. Chung
Cycles of Endurance, and Decade Lifetime at 103 °C. VLSI Technology and Circuits (2022)
W. Y. Yang, E. R. Hsieh, C. H. Cheng, B. Y. Chen, K. S. Li, Steve S. Chung
A Reliable Triple-Level Operation of Resistive-Gate Flash Featuring Forming-Free and High Immunity to Sneak Path. IRPS (2021)
E. R. Hsieh, H. W. Cheng, Z. H. Huang, C. H. Chuang, S. P. Yang, Steve S. Chung
A Pulsed RTN Transient Measurement Technique: Demonstration on the Understanding of the Switching in Resistance Memory. IRPS (2020)
Steve S. Chung
The Advances of OTP Memory for Embedded Applications in HKMG Generation and Beyond. ASICON (2019)
E. R. Hsieh, C. W. Chang, C. C. Chuang, H. W. Chen, Steve S. Chung
The Demonstration of Gate Dielectric-fuse 4kb OTP Memory Feasible for Embedded Applications in High-k Metal-gate CMOS Generations and Beyond. VLSI Circuits (2019)
Keji Zhou, Xiaoyong Xue, Jianguo Yang, Xiaoxin Xu, Hangbing Lv, Mingyu Wang, Ming-e Jing, Wenjun Liu, Xiaoyang Zeng, Steve S. Chung, Jing Li, Ming Liu
and K-means Clustering for Power Reduction. A-SSCC (2018)
Steve S. Chung, Xu-Feng Niu
Financial volatility estimation using functional gradient descent algorithm. Model. Assist. Stat. Appl. 12 (4) (2017)
Jack L. Chan, Steve S. Chung
Universal Switched-Current Integrator Blocks for SI Filter Design. ASP-DAC (1999)