E. R. Hsieh

Publication Activity (10 Years)

Years Active: 1977-2023
Publications (10 Years): 5

Top Topics

Deeper Understanding

Cognitive Functions

Top Venues

VLSI Technology and Circuits

Publications

E. R. Hsieh, Y. T. Tang, C. R. Liu, S. M. Wang, Y. L. Hsueh, R. Q. Lin, Y. X. Huang, Y. T. Chen
3-bits-per-cell 2T32CFE nvTCAM by Angstrom-laminated Ferroelectric Layers with 10¹¹ Cycles of Endurance and 4.92V of Ultra-wide Memory-windows for In-memory-searching. VLSI Technology and Circuits (2023)
E. R. Hsieh, J. K. Chang, T. Y. Tang, Y. J. Li, C. W. Liang, M. Y. Lin, S. Y. Huang, C. J. Su, J. C. Guo, Steve S. Chung
Cycles of Endurance, and Decade Lifetime at 103 °C. VLSI Technology and Circuits (2022)
W. Y. Yang, E. R. Hsieh, C. H. Cheng, B. Y. Chen, K. S. Li, Steve S. Chung
A Reliable Triple-Level Operation of Resistive-Gate Flash Featuring Forming-Free and High Immunity to Sneak Path. IRPS (2021)
E. R. Hsieh, H. W. Cheng, Z. H. Huang, C. H. Chuang, S. P. Yang, Steve S. Chung
A Pulsed RTN Transient Measurement Technique: Demonstration on the Understanding of the Switching in Resistance Memory. IRPS (2020)
E. R. Hsieh, C. W. Chang, C. C. Chuang, H. W. Chen, Steve S. Chung
The Demonstration of Gate Dielectric-fuse 4kb OTP Memory Feasible for Embedded Applications in High-k Metal-gate CMOS Generations and Beyond. VLSI Circuits (2019)
E. R. Hsieh, Robert A. Rasmussen, L. J. Vidunas, W. T. Davis
Delay test generation. DAC (1977)