Guido T. Sasse

Publication Activity (10 Years)

Years Active: 2008-2021
Publications (10 Years): 2

Top Topics

Code Generation

High Sensitivity

Statistical Model

Top Venues

Microelectron. Reliab.

Publications

Guido T. Sasse, Vignesh Subramanian, Ljubo Radic
Aging models for n- and p-type LDMOS covering low, medium and high VGS operation. IRPS (2021)
Guido T. Sasse
Hot carrier induced TDDB in HV MOS: Lifetime model and extrapolation to use conditions. IRPS (2018)
Guido T. Sasse, Martin Combrié
The temperature dependence of mixed mode degradation in bipolar transistors. Microelectron. Reliab. 52 (9-10) (2012)
Guido T. Sasse, Mustafa Acar, Fred G. Kuper, Jurriaan Schmitz
RF CMOS reliability simulations. Microelectron. Reliab. 48 (8-9) (2008)