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Aging models for n- and p-type LDMOS covering low, medium and high VGS operation.

Guido T. SasseVignesh SubramanianLjubo Radic
Published in: IRPS (2021)
Keyphrases
  • wide range
  • real time
  • experimental data
  • artificial intelligence
  • information systems
  • significantly lower
  • high sensitivity
  • computer vision
  • face recognition
  • prior knowledge
  • statistical model