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Characterisation of Photodiodes in 22 nm FDSOI at 850 nm.

Jelle H. T. BakkerMark S. Oude AlinkJurriaan SchmitzBram Nauta
Published in: ESSDERC (2023)
Keyphrases
  • real time
  • information systems
  • transmission electron microscopy
  • machine learning
  • case study
  • multiscale
  • pattern recognition
  • multi agent systems
  • artificial neural networks