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Identifying failure mechanisms in LDMOS transistors by analytical stability analysis.

Alessandro FerraraPeter G. SteenekenBoni K. BoksteenAnco HeringaA. J. ScholtenJurriaan SchmitzRaymond J. E. Hueting
Published in: ESSDERC (2014)
Keyphrases
  • stability analysis
  • nonlinear systems
  • gravitational search algorithm
  • high density
  • sliding mode
  • integrated circuit
  • stability margin
  • real time
  • neural network
  • fuzzy logic
  • vision system