Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip.
Cora SalmVictor M. Blanco CarballoJoost MelaiJurriaan SchmitzPublished in: Microelectron. Reliab. (2008)
Keyphrases
- post processing
- high speed
- cmos image sensor
- analog vlsi
- preprocessing
- low cost
- cmos technology
- image sensor
- ultra low power
- low power
- dynamic range
- single chip
- silicon on insulator
- circuit design
- solid state
- focal plane
- human experts
- infrared
- analog to digital converter
- filtering method
- random access memory
- chip design
- post processed
- feature selection
- machine learning
- high density
- x ray
- shape error concealment