Login / Signup

ESD robust high-voltage active clamps.

Guido NotermansOlivier QuittardAnco HeringaZeljko MrcaricaFabrice BlancHans van ZwolTheo SmedesThomas KellerPeter C. de Jong
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • high voltage
  • data sets
  • data mining
  • machine learning
  • genetic algorithm
  • evolutionary algorithm
  • knowledge discovery
  • small number
  • unsupervised learning
  • partial discharge