LENS DISTORTION
Experts
- Peter F. Sturm
- Tomás Pajdla
- Zuzana Kukelova
- Zhanyi Hu
- Yuchao Dai
- Xianghua Ying
- João Pedro Barreto
- In-So Kweon
- Aly A. Farag
- Luis Álvarez
- Stergios I. Roumeliotis
- Srikanth Saripalli
- Luis Gómez
- Marc Pollefeys
- Zhengyou Zhang
- Hui Zhang
- Laurent Kneip
- Jean-Marc Lavest
- Yuncai Liu
- Jun Sato
- Jen-Hui Chuang
- Martin Bujnak
- Hongbin Zha
- Pavel Rojtberg
- Richard I. Hartley
- Omar Ait-Aider
- Hongdong Li
- Moritz Knorr
- Hanqi Zhuang
- Jun-Sik Kim
- Yinqiang Zheng
- Kwan-Yee Kenneth Wong
- Ki-Sang Hong
- Christoph Stiller
- Miguel Alemán-Flores
- Yihong Wu
- Kalle Åström
- Luc Van Gool
- Yunsu Bok
Venues
- CoRR
- Sensors
- CVPR
- ICRA
- ICCV
- IROS
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICPR
- IGARSS
- IEEE Trans. Instrum. Meas.
- Remote. Sens.
- Pattern Recognit.
- Comput. Vis. Image Underst.
- BMVC
- ICPR (1)
- IEEE Access
- ITSC
- Pattern Recognit. Lett.
- ICASSP
- IEEE Trans. Geosci. Remote. Sens.
- Int. J. Comput. Vis.
- MVA
- IEEE Robotics Autom. Lett.
- Mach. Vis. Appl.
- CVPR Workshops
- Image Vis. Comput.
- WACV
- ROBIO
- J. Electronic Imaging
- J. Math. Imaging Vis.
- IEEE Trans. Image Process.
- ECCV (2)
- IVCNZ
- VISAPP (1)
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- IEEE Trans. Robotics
- ECCV (1)
- IEEE Trans. Robotics Autom.
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