Sylvain Dudit

Publication Activity (10 Years)

Years Active: 2004-2011
Publications (10 Years): 0

Publications

Guillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet
LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis. Microelectron. Reliab. 51 (9-11) (2011)
Philippe Galy, J. Bourgeat, Jean Jimenez, Blaise Jacquier, D. Marin-Cudraz, Sylvain Dudit
matrix ESD power devices for advanced CMOS technologies. Microelectron. Reliab. 51 (9-11) (2011)
Guillaume Bascoul, Philippe Perdu, A. Benigni, Sylvain Dudit, Guillaume Celi, Dean Lewis
Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis. Microelectron. Reliab. 51 (9-11) (2011)
Thierry Parrassin, Guillaume Celi, Sylvain Dudit, Michel Vallet
Failure analysis defect location on a real case 55 nm memory using dynamic power supply emulation. Microelectron. Reliab. 51 (9-11) (2011)
Philippe Galy, Sylvain Dudit, Michel Vallet, Ph. Larre, M. Bilinski, E. Petit, J. Beltritti, A. Dray, Jean Jimenez, F. Jezequel, R. Chevallier, C. Boutonnat, V. Varo
Inventory of silicon signatures induced by CDM event on deep sub-micronic CMOS-BICMOS technologies. Microelectron. Reliab. 50 (9-11) (2010)
Guillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet
Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below). Microelectron. Reliab. 50 (9-11) (2010)
Philippe Perdu, Jerome Di-Battista, Sylvain Dudit, Tomonori Nakamura
VLSI functional analysis by dynamic emission microscopy. Microelectron. Reliab. 50 (9-11) (2010)
Philippe Galy, Sylvain Dudit, Michel Vallet, C. Richier, Christophe Entringer, F. Jezequel, E. Petit, J. Beltritti
Impact and damage on deep sub-micron CMOS technology induced by substrate current due to ESD stress. Microelectron. Reliab. 49 (9-11) (2009)
Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectron. Reliab. 45 (9-11) (2005)
Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis
Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits? Microelectron. Reliab. 44 (9-11) (2004)