Inventory of silicon signatures induced by CDM event on deep sub-micronic CMOS-BICMOS technologies.
Philippe GalySylvain DuditMichel ValletPh. LarreM. BilinskiE. PetitJ. BeltrittiA. DrayJean JimenezF. JezequelR. ChevallierC. BoutonnatV. VaroPublished in: Microelectron. Reliab. (2010)