LOT SIZING
Experts
- Laurence A. Wolsey
- Alexandre Dolgui
- Manoranjan Maiti
- George L. Nemhauser
- Leopoldo Eduardo Cárdenas-Barrón
- Dimitris Bertsimas
- Reza Tavakkoli-Moghaddam
- Hui-Ming Wee
- Chengbin Chu
- Jinn-Tsair Teng
- Reha Uzsoy
- Fengqi You
- Ignacio E. Grossmann
- Bernardo Almada-Lobo
- Seyed Taghi Akhavan Niaki
- Stéphane Dauzère-Pérès
- Liang-Yuh Ouyang
- Safia Kedad-Sidhoum
- Lars Mönch
- Shabbir Ahmed
- Ata Allah Taleizadeh
- Céline Gicquel
- T. C. E. Cheng
- Chung-Yuan Dye
- Panos M. Pardalos
- Martin W. P. Savelsbergh
- Juan Pablo Vielma
- Yongpei Guan
- Bhaba R. Sarker
- Przemyslaw Ignaciuk
- Gilbert Laporte
- Tao Wu
- Laureano F. Escudero
- Feng Chu
- Robert Weismantel
- Oktay Günlük
- Daniel Kuhn
- Jing-Sheng Song
- Nabil Absi
Venues
- CoRR
- Eur. J. Oper. Res.
- Comput. Ind. Eng.
- Comput. Oper. Res.
- Oper. Res.
- Ann. Oper. Res.
- Oper. Res. Lett.
- J. Oper. Res. Soc.
- Math. Program.
- Int. J. Prod. Res.
- Expert Syst. Appl.
- Comput. Chem. Eng.
- IEEE Access
- WSC
- Manag. Sci.
- CDC
- Appl. Soft Comput.
- RAIRO Oper. Res.
- Manuf. Serv. Oper. Manag.
- INFORMS J. Comput.
- Int. J. Syst. Sci.
- OR
- IEEE Trans. Ind. Electron.
- J. Glob. Optim.
- J. Intell. Manuf.
- ACC
- OR Spectr.
- Math. Oper. Res.
- Int. Trans. Oper. Res.
- IEEM
- Appl. Math. Comput.
- Asia Pac. J. Oper. Res.
- CASE
- J. Sched.
- Int. J. Math. Oper. Res.
- Optim. Lett.
- SIAM J. Optim.
- IEEE Trans. Smart Grid
- IECON
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